Micrograph showing intermetallic particles contained in AA3104
The phases of the particles are distinguished based on morphological identification using SEM and compositional identification using EDS.
Scanning Electron Micrograph of 0.1um Pt coated on thick Cr substrate
The sample was heat-treated at 900/C for 20hours. The image depicts the formation of Pt-Cr crystals.
Electron Backscatter Diffraction (EBSD) map using a JEOL JSM-7001F Field Emission Scanning Electron Microscope
Microstructure of a Ti-6Al-4V alloy, processed by uniaxial compression using a Gleeble type 3800 testing machine.